Laser interferometry IX : applications : 22-23 July 1998, San Diego, California
著者
書誌事項
Laser interferometry IX : applications : 22-23 July 1998, San Diego, California
(Proceedings / SPIE -- the International Society for Optical Engineering, v. 3479)
SPIE, c1998
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注記
Includes bibliographical references and author index
内容説明・目次
内容説明
The various applications of laser interferometry are covered in this volume. The subjects include flatness and surface measurements, surface characterisation, and shape and distance measurement.
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