Astronomical data analysis II : 27-28 August 2002, Waikoloa, Hawaii, USA

著者

• Starck, Jean-Luc
• Murtagh, Fionn
• Society of Photo-optical Instrumentation Engineers
• International Commission for Optics

書誌事項

Astronomical data analysis II : 27-28 August 2002, Waikoloa, Hawaii, USA

Jean-Luc Starck, Fionn D. Murtagh chairs/editors ; sponsored and published by SPIE-the International Society for Optical Engineering ; cooperationg organizations, International Commission for Optics ... [et al]

（Proceedings / SPIE -- the International Society for Optical Engineering, v. 4847）

SPIE, c2002

注記

Includes bibliographical references and index

詳細情報

• NII書誌ID(NCID): BA61103758
• ISBN:
  • 0819446262
• 出版国コード: us
• タイトル言語コード: eng
• 本文言語コード: eng
• 出版地: Bellingham, Wash.
• ページ数/冊数: ix, 464 p.
• 大きさ: 28 cm
• 親書誌ID:
  • BA0022700X