Interfacial crack tip field mapping using visible and interferometers : a study of 3-D effects

著者

• Sinba, Jaydeep Kumar

書誌事項

Interfacial crack tip field mapping using visible and interferometers : a study of 3-D effects

Jaydeep Kumar Sinha

U.M.I. Dissertation Information Service, 1997

注記

Facsim. reprint of the author's thesis (Ph.D.)--Graduate Faculty of Auburn University

UMI No. 9802474

詳細情報

• NII書誌ID(NCID): BA61341439
• 出版国コード: us
• タイトル言語コード: eng
• 本文言語コード: eng
• 出版地: Ann Arbor, Mich.
• ページ数/冊数: xi, 109 p.
• 大きさ: 23 cm