Optical system contamination : effects, measurements, and control VII : 9-11 July 2002, Seattle, USA

著者

• Society of Photo-optical Instrumentation Engineers
• Chen, Philip T. C.
• Uy, O. Manuel

書誌事項

Optical system contamination : effects, measurements, and control VII : 9-11 July 2002, Seattle, USA

Philip T.C. Chen, O. Manuel Uy chairs/editors ; sponsored by SPIE--the International Society for Optical Engineering ; cooperating organizations, The Boeing Company (USA) ... [et al.]

（Proceedings / SPIE -- the International Society for Optical Engineering, v. 4774）

SPIE, c2002

注記

Includes bibliographical references and index

内容説明・目次

内容説明

Proceedings of SPIE present the original research papers presented at SPIE conferences and other high-quality conferences in the broad-ranging fields of optics and photonics. These books provide prompt access to the latest innovations in research and technology in their respective fields. Proceedings of SPIE are among the most cited references in patent literature.

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詳細情報

• NII書誌ID(NCID): BA61356764
• ISBN:
  • 081944541X
• 出版国コード: us
• タイトル言語コード: eng
• 本文言語コード: eng
• 出版地: Bellingham, Wash., USA
• ページ数/冊数: vii, 282 p.
• 大きさ: 28 cm
• 親書誌ID:
  • BA0022700X