Polarization measurement, analysis, and applications V : 8-9 July 2002, Seattle, USA

著者

• Society of Photo-optical Instrumentation Engineers
• Goldstein, Dennis H.
• Chenault, David B.

書誌事項

Polarization measurement, analysis, and applications V : 8-9 July 2002, Seattle, USA

Dennis H. Goldstein, David B. Chenault chairs/editors ; sponsored and published by SPIE--The International Society for Optical Engineering ; cooperating organizations, The Boeing Company (USA) ... [et al.]

（Proceedings / SPIE -- the International Society for Optical Engineering, v. 4819）

SPIE, c2002

注記

Includes bibliographical references and index

詳細情報

• NII書誌ID(NCID): BA61362417
• ISBN:
  • 0819445878
• 出版国コード: us
• タイトル言語コード: eng
• 本文言語コード: eng
• 出版地: Bellingham, Wash.
• ページ数/冊数: vii, 206 p.
• 大きさ: 28 cm
• 親書誌ID:
  • BA0022700X