Digital and analogue instrumentation : testing and measurement

著者

    • Kularatna, Nihal

書誌事項

Digital and analogue instrumentation : testing and measurement

Nihal Kularatna

(IEE electrical measurement series, 11)

Institution of Electrical Engineers, c2003

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注記

Includes bibliographical references and index

内容説明・目次

内容説明

To obtain the full value from instrumentation, users require familiarity with a number of basic concepts and an understanding of how those building blocks relate to one another. In this book, Nihal Kularatna provides an introduction to the main families of instruments for students and professionals who have to carry out practical work in electronics and measurement. For each family he covers internal design, use and applications, highlighting their advantages and limitations from a practical application viewpoint. Written in a simple, lucid and readable style, the book does not assume detailed knowledge but will give the reader an appropriate understanding of how to use instrumentation validly in its defined context. The book reviews the state-of-the art and extends the range of instruments to encompass digital families. The author also examines conventional and arbitrary waveform generators, spectrum analysis, logic analysers, instrument buses and VLSI testing, DSL/SDH/PDH and general transmission measurements, DSPs and the latest sensors. This book will be of interest to professional electrical and electronic engineers and students, especially those working on design and test, but any who make use of instruments and instrumentation systems.

目次

Chapter 1: Introduction Chapter 2: Enabling technologies Chapter 3: Data converters Chapter 4: Waveform parameters, multimeters and pulse techniques Chapter 5: Fundamentals of oscilloscopes Chapter 6: Recent developments on DSO techniques Chapter 7: Electronic counters Chapter 8: Conventional signal sources and arbitrary waveform generators Chapter 9: Spectrum analysis Chapter 10: Logic analysers Chapter 11: An introduction to instrument buses and VLSI testing Chapter 12: Transmission measurements Chapter 13: Digital signal processors Chapter 14: Sensors Chapter 15: Calibration of instruments

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詳細情報

  • NII書誌ID(NCID)
    BA61809789
  • ISBN
    • 0852969996
  • 出版国コード
    uk
  • タイトル言語コード
    eng
  • 本文言語コード
    eng
  • 出版地
    London
  • ページ数/冊数
    xxix, 645p
  • 大きさ
    25 cm
  • 分類
  • 件名
  • 親書誌ID
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