Spatially resolved characterization of local phenomena in materials and nanostructures : symposium held December 2-5, 2002, Boston, Massachusetts, U.S.A.

Author(s)

• Materials Research Society
• Piqueras, Javier
• Zypman, Fredy R.
• Bonnell, Dawn A.
• Shreve, Andrew P.

Bibliographic Information

Spatially resolved characterization of local phenomena in materials and nanostructures : symposium held December 2-5, 2002, Boston, Massachusetts, U.S.A.

editors, Javier Piqueras ... [et al.]

（Materials Research Society symposium proceedings, v. 738）

Materials Research Society, c2003

Note

Includes bibliographical references and indexes

Details

• NCID: BA62101317
• ISBN:
  • 1558996753
• Country Code: us
• Title Language Code: eng
• Text Language Code: eng
• Place of Publication: Warrendale, Pa.
• Pages/Volumes: xiii, 425 p.
• Size: 24 cm
• Parent Bibliography ID:
  • BA00013775