Test and measurement applications of optoelectronic devices : 21-22 January 2002, San Jose, USA

著者

• Society of Photo-optical Instrumentation Engineers
• Chin, Aland K.
• Dutta, Niloy K
• Herrick, Robert W.
• Linden, Kurt J.
• McGraw, Daniel J.

書誌事項

Test and measurement applications of optoelectronic devices : 21-22 January 2002, San Jose, USA

Aland K. Chin ... [et al.] chairs/editors ; sponsored and published by SPIE--The International Society for Optical Engineering

（Proceedings / SPIE -- the International Society for Optical Engineering, v. 4648）

SPIE, c2002

詳細情報

• NII書誌ID(NCID): BA6213427X
• ISBN:
  • 0819443875
• 出版国コード: us
• タイトル言語コード: eng
• 本文言語コード: eng
• 出版地: Bellingham, Wash.
• ページ数/冊数: viii, 180 p.
• 大きさ: 28 cm
• 親書誌ID:
  • BA0022700X