Memory, microprocessor, and ASIC

著者

• Chen, Wai-Kai

書誌事項

Memory, microprocessor, and ASIC

editor-in-chief Wai-Kai Chen

（Principles and applications in engineering series）

CRC Press, c2003

注記

Includes bibliographical references and index

内容説明・目次

内容説明

Timing, memory, power dissipation, testing, and testability are all crucial elements of VLSI circuit design. In this volume culled from the popular VLSI Handbook, experts from around the world provide in-depth discussions on these and related topics. Stacked gate, embedded, and flash memory all receive detailed treatment, including their power consumption and recent developments in low-power memories. Reflecting the rapid development and importance of systems-on-a-chip (SOCs), an entire chapter is devoted to application-specific integrated circuits (ASICs). Design-related topics include microprocessor architectures, layout methods, design verification, testability concepts, and various CAD tools. .

目次

System Timing. ROM/PROM/EPROM. SRAM. Embedded Memory. Flash Memories. Dynamic Random Access Memory. Low-Power Memory Circuits. Timing and Signal Integrity Analysis. Microprocessor Design Verification. Microprocessor Layout Method. Architecture. ASIC Design. Logic Synthesis for Field Programmable Gate Array (EPGA) Technology. Testability Concepts and DFT. ATPG and BIST. CAD Tools for BIST/DFT and Delay Faults.

「Nielsen BookData」 より

詳細情報

• NII書誌ID(NCID): BA6262649X
• ISBN:
  • 0849317371
• LCCN: 2002042927
• 出版国コード: us
• タイトル言語コード: eng
• 本文言語コード: eng
• 出版地: Boca Raton, FL.
• ページ数/冊数: xiv, 1 v. (various pagines)
• 大きさ: 26 cm
• 分類:
  • LCC : TK7895.M4
  • DC21 : 621.39/5
• 件名:
  • LCSH : Semiconductor storage devices
  • LCSH : Microprocessors
  • LCSH : Application specific integrated circuits
  • LCSH : Integrated circuits -- Very large scale integration
• 親書誌ID:
  • BA6177323X