2003 IEEE International Reliability Physics Symposium proceedings : 41st annual, Dallas, Texas, March 30-Apri 4, 2003

Author(s)

• International Reliability Physics Symposium
• IEEE Electron Devices Society
• IEEE Reliability Society

Bibliographic Information

2003 IEEE International Reliability Physics Symposium proceedings : 41st annual, Dallas, Texas, March 30-Apri 4, 2003

sponsored by the IEEE Electron Devices Society and the IEEE Reliability Society

Institute of Electrical and Electronics Engineers, c2002 , c2003

• : soft.

Other Title

03CH37400

Note

Includes bibliographical references

"IEEE Catalog No. 03CH37400" -- T. p.

Details

• NCID: BA6271753X
• ISBN:
  • 0780376498
• LCCN: 82640313
• Country Code: us
• Title Language Code: eng
• Text Language Code: eng
• Place of Publication: Piscataway, N.J.
• Pages/Volumes: x, 645 p.
• Size: 28 cm