ICMTS 2003, proceedings of the 2003 IEEE International Conference on Microelectronic Test Structures, Double Tree Hotel, Monterey, California, March 17-20, 2003

著者

• IEEE International Conference on Microelectronic Test Structures
• IEEE Electron Devices Society

書誌事項

ICMTS 2003, proceedings of the 2003 IEEE International Conference on Microelectronic Test Structures, Double Tree Hotel, Monterey, California, March 17-20, 2003

sponsored by the IEEE Electron Devices Society

Institute of Electrical and Electronics Engineers, c2003

タイトル別名

03CH37402

注記

"IEEE catalog number: 03CH37402" -- T. p. verso

Includes bibliographical references and index

詳細情報

• NII書誌ID(NCID): BA6271788X
• ISBN:
  • 0780376536
• LCCN: 2002112417
• 出版国コード: us
• タイトル言語コード: eng
• 本文言語コード: eng
• 出版地: [New York]
• ページ数/冊数: 249 p.
• 大きさ: 28 cm