Microprobe characterization of optoelectronic materials
Author(s)
Bibliographic Information
Microprobe characterization of optoelectronic materials
（Optoelectronic properties of semiconductors and superlattices / edited by M. O. Manasreh, v. 17）
Taylor & Francis, 2003
Available at 2 libraries
Note
Includes bibliographical references and index
Description and Table of Contents
Description
Each chapter in this book is written by a group of leading experts in one particular type of microprobe technique. They emphasize the ability of that technique to provide information about small structures (i.e. quantum dots, quantum lines), microscopic defects, strain, layer composition, and its usefulness as diagnostic technique for device degradation. Different types of probes are considered (electrons, photons and tips) and different microscopies (optical, electron microscopy and tunneling). It is an ideal reference for post-graduate and experienced researchers, as well as for crystal growers and optoelectronic device makers.
Table of Contents
1. Photoluminescence Imaging
2. MicroRaman Spectroscopy of Semiconductors: Principles and Applications
3. Near-Field Scanning Optical Microscopy of Semiconductor Nanostructures
4. Cross-sectional Scanning Tunneling Microscopy Studies of Heterostructures
5. Application of Transmission Electron Microscopy to Study Interfaces in Optoelectronic Materials
6. Electron Beam Induced Luminescence Studies of Low-dimensional Semiconductor Structures
7. X-ray Topography
8. Selective Etching and Complementary Microprobe Techniques (SFM, EBIC)
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