Annual Reliability and Maintainability Symposium, 2003 proceedings : the International symposium on product quality & integrity, Tampa, Florida, USA, 27-30 January 2003

Bibliographic Information

Annual Reliability and Maintainability Symposium, 2003 proceedings : the International symposium on product quality & integrity, Tampa, Florida, USA, 27-30 January 2003

Institute of Electrical and Electronics Engineers, c2003

Available at  / 4 libraries

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Note

Includes bibliographical references and index

"IEEE catalog number: 03CH37415" -- T. p. verso

Details

  • NCID
    BA62834690
  • ISBN
    • 0780377176
  • Country Code
    us
  • Title Language Code
    eng
  • Text Language Code
    eng
  • Place of Publication
    Piscataway, NJ
  • Pages/Volumes
    xviii, 622 p.
  • Size
    28 cm
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