Annual Reliability and Maintainability Symposium, 2003 proceedings : the International symposium on product quality & integrity, Tampa, Florida, USA, 27-30 January 2003
著者
書誌事項
Annual Reliability and Maintainability Symposium, 2003 proceedings : the International symposium on product quality & integrity, Tampa, Florida, USA, 27-30 January 2003
Institute of Electrical and Electronics Engineers, c2003
大学図書館所蔵 全4件
注記
Includes bibliographical references and index
"IEEE catalog number: 03CH37415" -- T. p. verso
内容説明・目次
内容説明
This symposium investigated such topics as: software reliability; product design and assurance; repairable systems modelling; accelerated life testing; safety and risk management; probabilistic risk assessment; reliability prediction; and ageing.
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