Speckle metrology 2003 : 18-20 June 2003, Trondheim, Norway

著者

• Gastinger, Kay
• Løkberg, Ole Johan
• Winther, Svein

書誌事項

Speckle metrology 2003 : 18-20 June 2003, Trondheim, Norway

Kay Gastinger, Ole Johan Løkberg and Svein Winther /editors ; sponsored and organized by SINTEF (Norway) and NTNU--Norwegian University of Science and Technology (Norway) ; cooperating organizations, SPIE--The International Society for Optical Engineering and EOS-- European Optical Society

（Proceedings / SPIE -- the International Society for Optical Engineering, v. 4933）

SPIE--the Internatinal Society for Optical Engineering, c2003

注記

Includes bibliographical references and index

詳細情報

• NII書誌ID(NCID): BA63255961
• ISBN:
  • 0819447285
• 出版国コード: us
• タイトル言語コード: eng
• 本文言語コード: eng
• 出版地: Bellingham, Wash
• ページ数/冊数: ix, 390 p.
• 大きさ: 29 cm
• 親書誌ID:
  • BA0022700X