Speckle metrology 2003 : 18-20 June 2003, Trondheim, Norway

Author(s)

• Gastinger, Kay
• Løkberg, Ole Johan
• Winther, Svein

Bibliographic Information

Speckle metrology 2003 : 18-20 June 2003, Trondheim, Norway

Kay Gastinger, Ole Johan Løkberg and Svein Winther /editors ; sponsored and organized by SINTEF (Norway) and NTNU--Norwegian University of Science and Technology (Norway) ; cooperating organizations, SPIE--The International Society for Optical Engineering and EOS-- European Optical Society

（Proceedings / SPIE -- the International Society for Optical Engineering, v. 4933）

SPIE--the Internatinal Society for Optical Engineering, c2003

Note

Includes bibliographical references and index

Details

• NCID: BA63255961
• ISBN:
  • 0819447285
• Country Code: us
• Title Language Code: eng
• Text Language Code: eng
• Place of Publication: Bellingham, Wash
• Pages/Volumes: ix, 390 p.
• Size: 29 cm
• Parent Bibliography ID:
  • BA0022700X