Mutation testing for the new century

著者

• Wong, W. Eric
• Mutation 2000

書誌事項

Mutation testing for the new century

edited by W. Eric Wong

（The Kluwer international series on advances in database systems, 24）

Kluwer Academic Publishers, c2001

注記

Proceedings of Mutation 2000 : a symposium on mutation testing for the new century, October 6-7, 2000, San Jose, California

Includes bibliographical references and index

詳細情報

• NII書誌ID(NCID): BA63273329
• ISBN:
  • 0792373235
• LCCN: 2001029620
• 出版国コード: us
• タイトル言語コード: eng
• 本文言語コード: eng
• 出版地: Boston
• ページ数/冊数: viii, 118 p.
• 大きさ: 29 cm
• 分類:
  • LCC : QA76.76.T48
  • DC21 : 005.1/4
• 件名:
  • LCSH : Mutation testing of computer programs -- Congresses
  • LCSH : Computer programs -- Testing -- Congresses
• 親書誌ID:
  • BA28270592