ISTFA 2002 : proceedings of the 28th International Symposium for Testing and Failure Analysis : 3-7 November 2002, Phoenix Civic Center, Phoenix, Ariz.

著者

• International Symposium for Testing and Failure Analysis
• ASM International
• Electronic Device Failure Analysis Society

書誌事項

ISTFA 2002 : proceedings of the 28th International Symposium for Testing and Failure Analysis : 3-7 November 2002, Phoenix Civic Center, Phoenix, Ariz.

sponsored by EDFAS, ISTFA

ASM International, 2002

タイトル別名

Proceedings of the 28th International Symposium for Testing and Failure Analysis

Conference proceedings from the 28th International Symposium for Testing and Failure Analysis

注記

Includes bibliographical references and index

詳細情報

• NII書誌ID(NCID): BA63991140
• ISBN:
  • 0871707713
• 出版国コード: us
• タイトル言語コード: eng
• 本文言語コード: eng
• 出版地: Materials Park, Ohio
• ページ数/冊数: xxiv, 789 p.
• 大きさ: 28 cm.
• 付属資料: CD-ROM
• 件名:
  • LCSH : Electronics -- Materials -- Testing -- Congresses
  • LCSH : Electronic apparatus and appliances -- Testing. -- Congresses