Technologies for synthetic environments: Hardware-in-the-loop testing VIII : 21-22 April 2003, Oriando, Florida, USA

著者

• Murrer, Rovert Lee

書誌事項

Technologies for synthetic environments: Hardware-in-the-loop testing VIII : 21-22 April 2003, Oriando, Florida, USA

Robert Lee Murrer, Jr., chair/editor ; sponsored and published by SPIE--the International Society for Optical Engineering

（Proceedings / SPIE -- the International Society for Optical Engineering, v.5092）

SPIE, c2003

注記

Includes bibliographical references and index

詳細情報

• NII書誌ID(NCID): BA64197135
• ISBN:
  • 0819449520
• 出版国コード: us
• タイトル言語コード: eng
• 本文言語コード: eng
• 出版地: Bellingham, Wash.
• ページ数/冊数: viii, 322 p.
• 大きさ: 28 cm
• 親書誌ID:
  • BA0022700X