Proceedings, 18th IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems, 3-5 November 2003, Boston, Massachusetts

著者

• IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems
• IEEE Computer Society. Test Technology Technical Council
• IEEE Computer Society. Technical Committee on Fault-Tolerant Computing
• IEEE Computer Society
• Bolchini, C.

書誌事項

Proceedings, 18th IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems, 3-5 November 2003, Boston, Massachusetts

[edited by C. Bolchini ... [et al.] ] ; sponsored by the Counci the IEEE Computer Society Technical Committee on Fault-Tolerant Computing, IEEE Computer Society Test Technology Technicall

IEEE Computer Society, c2003

タイトル別名

DFT2003

PR02042

注記

Includes bibliographical references and index

"IEEE Computer Society Press Order Number PR02042"--on T.p. verso

詳細情報

• NII書誌ID(NCID): BA64469166
• ISBN:
  • 0769520421
• 出版国コード: us
• タイトル言語コード: eng
• 本文言語コード: eng
• 出版地: Los Alamitos, Calif.
• ページ数/冊数: xii, 607 p.
• 大きさ: 23 cm