Proceedings, 18th IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems, 3-5 November 2003, Boston, Massachusetts

Author(s)

• IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems
• IEEE Computer Society. Test Technology Technical Council
• IEEE Computer Society. Technical Committee on Fault-Tolerant Computing
• IEEE Computer Society
• Bolchini, C.

Bibliographic Information

Proceedings, 18th IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems, 3-5 November 2003, Boston, Massachusetts

[edited by C. Bolchini ... [et al.] ] ; sponsored by the Counci the IEEE Computer Society Technical Committee on Fault-Tolerant Computing, IEEE Computer Society Test Technology Technicall

IEEE Computer Society, c2003

Other Title

DFT2003

PR02042

Note

Includes bibliographical references and index

"IEEE Computer Society Press Order Number PR02042"--on T.p. verso

Details

• NCID: BA64469166
• ISBN:
  • 0769520421
• Country Code: us
• Title Language Code: eng
• Text Language Code: eng
• Place of Publication: Los Alamitos, Calif.
• Pages/Volumes: xii, 607 p.
• Size: 23 cm