Proceedings of the 2002 IEEE International Workshop on Memory Technology, Design and Testing : (MTDT 2002) : 10-12 July, 2002, Isle of Bendor, France

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Bibliographic Information

Proceedings of the 2002 IEEE International Workshop on Memory Technology, Design and Testing : (MTDT 2002) : 10-12 July, 2002, Isle of Bendor, France

editors, Bernard Courtois, Thomas Wik, Yervant Zorian ; sponsored by IEEE Computer Society, IEEE Computer Society Technical Council on Test Technology, IEEE Computer Society Technical Committee on VLSI ; in cooperation with IEEE Solid-State Circuits Society

IEEE Computer Society, c2002

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Other Title

Memory technology, design and testing

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Note

"IEEE Computer Society Order Number PR01617"--T.p. verso

"... 10th anniversary of the Workshop ..."--P. x

Includes bibliographical references and index

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Description and Table of Contents

Volume

ISBN 9780769516172

Description

This text contains information on designing and testing computer hardware as presented at the 2002 IEEE International Memory Technology, Design and Testing (MTDT 2002).
Volume

: bookbroker ISBN 9780769516189

Description

"IEEE Computer Society Order Number PR01617"--T.p. verso.

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