{"@context":{"owl":"http://www.w3.org/2002/07/owl#","bibo":"http://purl.org/ontology/bibo/","foaf":"http://xmlns.com/foaf/0.1/","rdfs":"http://www.w3.org/2000/01/rdf-schema#","prism":"http://prismstandard.org/namespaces/basic/2.0/","cinii":"http://ci.nii.ac.jp/ns/1.0/","dc":"http://purl.org/dc/elements/1.1/","dcterms":"http://purl.org/dc/terms/"},"@id":"https://ci.nii.ac.jp/ncid/BA65077489.json","@graph":[{"@id":"https://ci.nii.ac.jp/ncid/BA65077489#entity","@type":"bibo:Book","foaf:isPrimaryTopicOf":{"@id":"https://ci.nii.ac.jp/ncid/BA65077489.json"},"dc:title":[{"@value":"X-ray scattering from semiconductors"}],"dc:creator":"Paul F. Fewster","dc:publisher":[{"@value":"Imperial College Press"}],"dcterms:extent":"xiv, 299 p.","cinii:size":"24 cm","dc:language":"eng","dc:date":"2003","cinii:ncid":"BA65077489","prism:edition":"2nd ed","cinii:ownerCount":"9","foaf:maker":[{"@id":"https://ci.nii.ac.jp/author/DA14280743#entity","@type":"foaf:Person","foaf:name":[{"@value":"Fewster, Paul F."}]}],"bibo:owner":[{"@id":"https://ci.nii.ac.jp/library/FA012080","@type":"foaf:Organization","foaf:name":"東京大学 物性研究所 図書室","rdfs:seeAlso":{"@id":"https://opac.dl.itc.u-tokyo.ac.jp/opac/opac_openurl/?ncid=BA65077489"}},{"@id":"https://ci.nii.ac.jp/library/FA001991","@type":"foaf:Organization","foaf:name":"電気通信大学 附属図書館","rdfs:seeAlso":{"@id":"https://uec.primo.exlibrisgroup.com/discovery/search?query=lds08,contains,BA65077489&tab=LibraryCatalog&search_scope=MyInstitution&vid=81UEC_INST:UEC"}},{"@id":"https://ci.nii.ac.jp/library/FA002495","@type":"foaf:Organization","foaf:name":"名古屋大学 工学 図書室","rdfs:seeAlso":{"@id":"https://m-opac.nul.nagoya-u.ac.jp/iwjs0023opc/ufirdi.do?ufi_target=ctlsrh&ncid=BA65077489&initFlg=_RESULT_SET_NOTBIB"}},{"@id":"https://ci.nii.ac.jp/library/FA002702","@type":"foaf:Organization","foaf:name":"京都大学 工学部","rdfs:seeAlso":{"@id":"https://kuline.kulib.kyoto-u.ac.jp/opac/opac_openurl/?ncid=BA65077489"}},{"@id":"https://ci.nii.ac.jp/library/FA002848","@type":"foaf:Organization","foaf:name":"大阪大学 附属図書館 総合図書館","rdfs:seeAlso":{"@id":"https://opac.library.osaka-u.ac.jp/opac/opac_openurl/?ncid=BA65077489"}},{"@id":"https://ci.nii.ac.jp/library/FA007295","@type":"foaf:Organization","foaf:name":"大同大学 図書館"},{"@id":"https://ci.nii.ac.jp/library/FA008913","@type":"foaf:Organization","foaf:name":"福岡大学 図書館","rdfs:seeAlso":{"@id":"https://fuopac.lib.fukuoka-u.ac.jp/opac/opac_openurl/?ncid=BA65077489"}},{"@id":"https://ci.nii.ac.jp/library/FA009177","@type":"foaf:Organization","foaf:name":"大学共同利用機関法人 高エネルギー加速器研究機構","rdfs:seeAlso":{"@id":"https://lib-extopc.kek.jp/opac/opac_openurl/?ncid=BA65077489"}},{"@id":"https://ci.nii.ac.jp/library/FA023633","@type":"foaf:Organization","foaf:name":"東京都立産業技術大学院大学 附属図書館"}],"prism:publicationDate":["c2003"],"cinii:note":["Previous ed.: 1999"],"dc:subject":["DC21:539.7222"],"foaf:topic":[{"@id":"https://ci.nii.ac.jp/books/search?q=X-rays+--+Scattering","dc:title":"X-rays -- Scattering"},{"@id":"https://ci.nii.ac.jp/books/search?q=Semiconductors","dc:title":"Semiconductors"}],"dcterms:hasPart":[{"@id":"urn:isbn:1860943608"}]}]}