Proceedings : International Test Conference 2003

著者

• International Test Conference
• IEEE Computer Society. Test Technology Technical Council
• Institute of Electrical and Electronics Engineers. Philadelphia Section

書誌事項

Proceedings : International Test Conference 2003

[sponsored by IEEE Computer Society, Test Technology Technical Council and IEEE Philadelphia Section]

International Test Conference, c2003

タイトル別名

International Test Conference 2003 : Proceedings : September 30-October 2, 2003, Charlotte Convention Center, Charlotte, NC, USA

注記

IEEE Catalog Number: 03CH37494

Includes bibliographical references and index

子書誌あり

• NII書誌ID(NCID): BA6540053X
• ISBN:
  • 0780381068
• 出版国コード: us
• タイトル言語コード: eng
• 本文言語コード: eng
• 出版地: Washington, D.C.
• ページ数/冊数: xvi, 1334 p.
• 大きさ: 28 cm