Proceedings : International Test Conference 2003

Author(s)

• International Test Conference
• IEEE Computer Society. Test Technology Technical Council
• Institute of Electrical and Electronics Engineers. Philadelphia Section

Bibliographic Information

Proceedings : International Test Conference 2003

[sponsored by IEEE Computer Society, Test Technology Technical Council and IEEE Philadelphia Section]

International Test Conference, c2003

Other Title

International Test Conference 2003 : Proceedings : September 30-October 2, 2003, Charlotte Convention Center, Charlotte, NC, USA

Note

IEEE Catalog Number: 03CH37494

Includes bibliographical references and index

子書誌あり

• NCID: BA6540053X
• ISBN:
  • 0780381068
• Country Code: us
• Title Language Code: eng
• Text Language Code: eng
• Place of Publication: Washington, D.C.
• Pages/Volumes: xvi, 1334 p.
• Size: 28 cm