Chemical-mechanical planarization : symposium held April 22-24, 2003, San Francisco, California, U.S.A.

著者

    • Boning, Duane S.
    • Devriendt, Katia
    • Oliver, Michael R.
    • Stein, David J.

書誌事項

Chemical-mechanical planarization : symposium held April 22-24, 2003, San Francisco, California, U.S.A.

editors, Duane S. Boning ... [et al.]

(Materials Research Society symposium proceedings, v. 767)

Materials Research Society, c2003

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注記

Includes bibliographical references and indexes

内容説明・目次

内容説明

Chemical-mechanical planarization (CMP) has emerged as a critical fabrication technology for advanced integrated circuits. Even as the applications of CMP have diversified and we have begun to understand aspects of the physics and chemistry of the process, a new generation of CMP innovations is unfolding. New slurries and consumables are under development. New applications to novel devices continue to appear. This book, the most recent in a successful series on CMP, offers a review of the advances to date and provides a comprehensive discussion of the future challenges that must be overcome. Presentations from academia, government labs and industry are featured. Topics include; CMP modeling; CMP science; CMP slurries and particles for planarization of copper, oxide, and other materials; planarization applications including shallow trench isolation (STI), copper damascene, and novel devices and CMP integration.

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詳細情報

  • NII書誌ID(NCID)
    BA65410307
  • ISBN
    • 1558997040
  • 出版国コード
    us
  • タイトル言語コード
    eng
  • 本文言語コード
    eng
  • 出版地
    Warrendale, Pa.
  • ページ数/冊数
    xi, 348 p.
  • 大きさ
    24 cm
  • 親書誌ID
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