Electrical Overstress/Electrostatic Discharge Symposium proceedings, 1982, Orlando, Florida September 21-23, 1982

著者

• Electrical Overstress/Electrostatic Discharge Symposium
• IIT Research Institute

書誌事項

Electrical Overstress/Electrostatic Discharge Symposium proceedings, 1982, Orlando, Florida September 21-23, 1982

sponsored by IIT Research Institute

Reliability Analysis Center, c1983

注記

"Ordering no. EOS-4."

• NII書誌ID(NCID): BA65811002
• 出版国コード: us
• タイトル言語コード: eng
• 本文言語コード: eng
• 出版地: Griffiss AFB, NY.
• ページ数/冊数: v, 217 p.
• 大きさ: 28 cm