Machine vision applications in industrial inspection XI :proceedings of electronic imaging science and technology 2003 : 22-24 January 2003, Santa Clara, California, USA

Author(s)

• Hunt, Martin A.
• Price, Jeffery R.
• IS & T--the Society for Imaging Science and Technology
• Society of Photo-optical Instrumentation Engineers

Bibliographic Information

Machine vision applications in industrial inspection XI :proceedings of electronic imaging science and technology 2003 : 22-24 January 2003, Santa Clara, California, USA

Martin A. Hunt, Jeffery R. Price, chair/editor ; sponsored by IS&T--the Society for Imaging Science and Technology, SPIE--the International Society for Optical Engineering

（Proceedings / SPIE -- the International Society for Optical Engineering, v. 5011）

SPIE, c2003

Note

Includes bibliographical references and index

Details

• NCID: BA65836105
• ISBN:
  • 0819448117
• Country Code: us
• Title Language Code: eng
• Text Language Code: eng
• Place of Publication: Bellingham, Wash.
• Pages/Volumes: vii, 324 p.
• Size: 28 cm
• Classification:
  • LCC : TS156.2.
  • DC21 : 670.42/5
• Subject Headings:
  • LCSH : Engineering inspection -- Automation -- Congresses
  • LCSH : Computer vision -- Industrial applications -- Congresses
  • LCSH : Quality control -- Optical methods -- Automation -- Congresses
  • LCSH : Mensuration -- Congresses
• Parent Bibliography ID:
  • BA0022700X