GaAs IC Symposium : IEEE Gallium Arsenide Integrated Circuit Symposium : 25th Annual, Technical Digest 2003, San Diego, California, November 9-12,2003

Author(s)

• IEEE Gallium Arsenide Integrated Circuit Symposium
• IEEE Electron Devices Society
• IEEE Microwave Theory and Techniques Society
• IEEE Solid-State Circuits Society

Bibliographic Information

GaAs IC Symposium : IEEE Gallium Arsenide Integrated Circuit Symposium : 25th Annual, Technical Digest 2003, San Diego, California, November 9-12,2003

sponsored by the IEEE Electron Divices Society ; technically co-sponsored by the IEEE Microwave Theory and Techniques Society, and the IEEE Solid-State Circuits Society

IEEE Service Center, c2003

Other Title

03CH37445

Note

"IEEE catalog number 03CH37445" --on T.p. verso

Includes bibliographical references and index

Description and Table of Contents

Description

Covers topics including IC testing & methodology, packaging technology reliability, advanced device applications, system applications, and optoelectronics and OEIC applications.

Table of Contents

• Innovative RFIIC device & circuit concepts - circuit design & fabrication
• manufacturing technology & cost issues
• CAD/CAM/CAT tools & techniques
• IC testing & methodology
• packaging technology reliability
• advanced device applications
• system applications
• optoelectronics and OEIC applications.

by "Nielsen BookData"

Details

• NCID: BA65911404
• ISBN:
  • 0780378334
• Country Code: us
• Title Language Code: eng
• Text Language Code: eng
• Place of Publication: Piscataway, N.J.
• Pages/Volumes: 304 p.
• Size: 28 cm