GaAs IC Symposium : IEEE Gallium Arsenide Integrated Circuit Symposium : 25th Annual, Technical Digest 2003, San Diego, California, November 9-12,2003
著者
書誌事項
GaAs IC Symposium : IEEE Gallium Arsenide Integrated Circuit Symposium : 25th Annual, Technical Digest 2003, San Diego, California, November 9-12,2003
IEEE Service Center, c2003
- タイトル別名
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03CH37445
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注記
"IEEE catalog number 03CH37445" --on T.p. verso
Includes bibliographical references and index
内容説明・目次
内容説明
Covers topics including IC testing & methodology, packaging technology reliability, advanced device applications, system applications, and optoelectronics and OEIC applications.
目次
- Innovative RFIIC device & circuit concepts - circuit design & fabrication
- manufacturing technology & cost issues
- CAD/CAM/CAT tools & techniques
- IC testing & methodology
- packaging technology reliability
- advanced device applications
- system applications
- optoelectronics and OEIC applications.
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