11th Annual Proceedings : Reliability Physics 1973, Lsa Vegas, Nevada, April 3-5, 1973

著者

• International Reliability Physics Symposium
• IEEE Electron Devices Group
• IEEE Reliability Group

書誌事項

11th Annual Proceedings : Reliability Physics 1973, Lsa Vegas, Nevada, April 3-5, 1973

sponsored by the IEEE Electron Devices Group and the IEEE Reliability Group

Electron Device and Reliability Group of the Institute of Electrical and Electronics Engineers Inc., c1973

タイトル別名

Reliability Physics 11th Annual proceedings 1973

注記

Includes bibliographies

詳細情報

• NII書誌ID(NCID): BA65960454
• 出版国コード: us
• タイトル言語コード: eng
• 本文言語コード: eng
• 出版地: New York
• ページ数/冊数: 318 p.
• 大きさ: 28 cm