{"@context":{"owl":"http://www.w3.org/2002/07/owl#","bibo":"http://purl.org/ontology/bibo/","foaf":"http://xmlns.com/foaf/0.1/","rdfs":"http://www.w3.org/2000/01/rdf-schema#","prism":"http://prismstandard.org/namespaces/basic/2.0/","cinii":"http://ci.nii.ac.jp/ns/1.0/","dc":"http://purl.org/dc/elements/1.1/","dcterms":"http://purl.org/dc/terms/"},"@id":"https://ci.nii.ac.jp/ncid/BA6596431X.json","@graph":[{"@id":"https://ci.nii.ac.jp/ncid/BA6596431X#entity","@type":"bibo:Book","foaf:isPrimaryTopicOf":{"@id":"https://ci.nii.ac.jp/ncid/BA6596431X.json"},"dc:title":[{"@value":"21st annual proceedings : Reliability Physics 1983, Phoenix, Arizona, April 5, 6, 7, 1983"}],"dcterms:alternative":["Reliability Physics, 21st annual proceedings 1983"],"dc:creator":"sponsored by the IEEE Electron Devices Society and the IEEE Reliability Society","dc:publisher":[{"@value":"Electron Device and Reliability Society of the Institute of Electrical and Electronics Engineers"}],"dcterms:extent":"viii, 356 p.","cinii:size":"28 cm","dc:language":"eng","dc:date":"1983","cinii:ncid":"BA6596431X","cinii:ownerCount":"2","foaf:maker":[{"@id":"https://ci.nii.ac.jp/author/DA11572276#entity","@type":"foaf:Person","foaf:name":[{"@value":"International Reliability Physics Symposium"}]},{"@id":"https://ci.nii.ac.jp/author/DA01257512#entity","@type":"foaf:Person","foaf:name":[{"@value":"IEEE Electron Devices Society"}]},{"@id":"https://ci.nii.ac.jp/author/DA03215295#entity","@type":"foaf:Person","foaf:name":[{"@value":"IEEE Reliability Society"}]}],"bibo:owner":[{"@id":"https://ci.nii.ac.jp/library/FA001652","@type":"foaf:Organization","foaf:name":"筑波大学 附属図書館 中央図書館","rdfs:seeAlso":{"@id":"https://www.tulips.tsukuba.ac.jp/mylimedio/search/search.do?target=local&mode=comp&ncid=BA6596431X"}},{"@id":"https://ci.nii.ac.jp/library/FA000106","@type":"foaf:Organization","foaf:name":"東京科学大学 大岡山図書館","rdfs:seeAlso":{"@id":"https://topics.libra.titech.ac.jp/recordID/catalog.bib/BA6596431X"}}],"prism:publicationDate":["c1983"],"cinii:note":["\"1983 International Reliability Physics Symposium\"--T.p. verso","General chairman: D.L. Burgess","\"IEEE catalog no. 83CH1846-5.\"","\"Library of Congress Catalog Card no. 82-640313.\"","\"A bonus publication from your Reliability Society\"--Cover","Includes bibliographical references"],"foaf:topic":[{"@id":"https://ci.nii.ac.jp/books/search?q=Electronic+apparatus+and+appliances+--+Reliability+Congresses","dc:title":"Electronic apparatus and appliances -- Reliability Congresses"},{"@id":"https://ci.nii.ac.jp/books/search?q=Electronic+apparatus+and+appliances+--+Testing+Congresses","dc:title":"Electronic apparatus and appliances -- Testing Congresses"},{"@id":"https://ci.nii.ac.jp/books/search?q=Integrated+circuits+--+Reliability+Congresses","dc:title":"Integrated circuits -- Reliability Congresses"},{"@id":"https://ci.nii.ac.jp/books/search?q=Integrated+circuits+--+Testing+Congresses","dc:title":"Integrated circuits -- Testing Congresses"}]}]}