10th Annual Proceedings : Reliability Physics 1972, Lsa Vegas, Nevada, April 5-7, 1972

著者

• Reliability Physics Symposium
• IEEE Electron Devices Group
• IEEE Reliability Group

書誌事項

10th Annual Proceedings : Reliability Physics 1972, Lsa Vegas, Nevada, April 5-7, 1972

sponsored by the IEEE Electron Devices Group and the IEEE Reliability Group

Electron Device and Reliability Groups of the Institute of Electrical and Electronics Engineers Inc., c1972

タイトル別名

Reliability Physics 10th Annual proceedings 1972

注記

Includes bibliographies

Catalog No. 72CHO628-8-PHY

詳細情報

• NII書誌ID(NCID): BA65979598
• 出版国コード: us
• タイトル言語コード: eng
• 本文言語コード: eng
• 出版地: New York
• ページ数/冊数: viii, 219 p.
• 大きさ: 28 cm