Bibliographic Information

Analytical electron microscopy for materials science

D. Shindo, T. Oikawa

Springer, c2002

  • pbk.

Other Title

材料評価のための分析電子顕微鏡法 <BA41742572>

Uniform Title

Zairyō hyōka no tameno bunseki denshi kenbikyōhō

Available at  / 5 libraries

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Includes bibliographical references and index

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