2002 IEEE International Integrated Reliability Workshop final report, Stanford Sierra Camp, Lake Tahoe, California, October 21-24, 2002

Author(s)

• International Integrated Reliability Workshop
• IEEE Electron Devices Society
• IEEE Reliability Society

Bibliographic Information

2002 IEEE International Integrated Reliability Workshop final report, Stanford Sierra Camp, Lake Tahoe, California, October 21-24, 2002

sponsored by the IEEE Electron Devices Society and the IEEE Reliability Society

IEEE Operations Center, c2002

• :softbound

Other Title

02TH8634

Note

"IEEE Catalog No. 02TH8634"--verso of T.p.

Includes bibliographical references

Details

• NCID: BA66524709
• ISBN:
  • 0780375580
• LCCN: 2002106802
• Country Code: us
• Title Language Code: eng
• Text Language Code: eng
• Place of Publication: Piscataway, N.J.
• Pages/Volumes: v, 214 p.
• Size: 28 cm
• Classification:
  • LCC : TK7874
  • DC21 : 621.3815
• Subject Headings:
  • LCSH : Integrated circuits -- Reliability Congresses
  • LCSH : Integrated circuits -- Wafer-scale integration -- Reliability Congresses