2002 IEEE International Integrated Reliability Workshop final report, Stanford Sierra Camp, Lake Tahoe, California, October 21-24, 2002

著者

• International Integrated Reliability Workshop
• IEEE Electron Devices Society
• IEEE Reliability Society

書誌事項

2002 IEEE International Integrated Reliability Workshop final report, Stanford Sierra Camp, Lake Tahoe, California, October 21-24, 2002

sponsored by the IEEE Electron Devices Society and the IEEE Reliability Society

IEEE Operations Center, c2002

• :softbound

タイトル別名

02TH8634

注記

"IEEE Catalog No. 02TH8634"--verso of T.p.

Includes bibliographical references

詳細情報

• NII書誌ID(NCID): BA66524709
• ISBN:
  • 0780375580
• LCCN: 2002106802
• 出版国コード: us
• タイトル言語コード: eng
• 本文言語コード: eng
• 出版地: Piscataway, N.J.
• ページ数/冊数: v, 214 p.
• 大きさ: 28 cm
• 分類:
  • LCC : TK7874
  • DC21 : 621.3815
• 件名:
  • LCSH : Integrated circuits -- Reliability Congresses
  • LCSH : Integrated circuits -- Wafer-scale integration -- Reliability Congresses