2003 IEEE International Integrated Reliability Workshop final report, Stanford Sierra Camp, Lake Tahoe, California, October 20-23, 2003

著者

• International Integrated Reliability Workshop
• IEEE Electron Devices Society
• IEEE Reliability Society

書誌事項

2003 IEEE International Integrated Reliability Workshop final report, Stanford Sierra Camp, Lake Tahoe, California, October 20-23, 2003

sponsored by the IEEE Electron Devices Society and the IEEE Reliability Society

IEEE Operations Center, c2003

タイトル別名

03TH8715

注記

"IEEE Catalog No. 03TH8715"--verso of T.p.

Includes bibliographical references

• NII書誌ID(NCID): BA67116049
• ISBN:
  • 0780381572
• LCCN: 2003110309
• 出版国コード: us
• タイトル言語コード: eng
• 本文言語コード: eng
• 出版地: Piscataway, N.J.
• ページ数/冊数: viii, 182 p.
• 大きさ: 28 cm
• 分類:
  • LCC : TK7874
  • DC21 : 621.3815
• 件名:
  • LCSH : Integrated circuits -- Reliability Congresses
  • LCSH : Integrated circuits -- Wafer-scale integration -- Reliability Congresses