2003 IEEE International Integrated Reliability Workshop final report, Stanford Sierra Camp, Lake Tahoe, California, October 20-23, 2003

Author(s)

• International Integrated Reliability Workshop
• IEEE Electron Devices Society
• IEEE Reliability Society

Bibliographic Information

2003 IEEE International Integrated Reliability Workshop final report, Stanford Sierra Camp, Lake Tahoe, California, October 20-23, 2003

sponsored by the IEEE Electron Devices Society and the IEEE Reliability Society

IEEE Operations Center, c2003

Other Title

03TH8715

Note

"IEEE Catalog No. 03TH8715"--verso of T.p.

Includes bibliographical references

Details

• NCID: BA67116049
• ISBN:
  • 0780381572
• LCCN: 2003110309
• Country Code: us
• Title Language Code: eng
• Text Language Code: eng
• Place of Publication: Piscataway, N.J.
• Pages/Volumes: viii, 182 p.
• Size: 28 cm
• Classification:
  • LCC : TK7874
  • DC21 : 621.3815
• Subject Headings:
  • LCSH : Integrated circuits -- Reliability Congresses
  • LCSH : Integrated circuits -- Wafer-scale integration -- Reliability Congresses