Advanced technology and reliability of electronic devices and systems : proceedings of the 8th International Workshop, Department of Mechanical Sciences and Engineering, Tokyo Institute of Technology, January 15, 2004, Meeting Room at Main Building of International House,Tokyo Institute of Technology

著者

• International Workshop, Department of Mechanical Sciences and Engineering
• 岸本, 喜久雄 キシモト, キクオ
• Lee, Soon-bok
• Yu, Qiang

書誌事項

Advanced technology and reliability of electronic devices and systems : proceedings of the 8th International Workshop, Department of Mechanical Sciences and Engineering, Tokyo Institute of Technology, January 15, 2004, Meeting Room at Main Building of International House,Tokyo Institute of Technology

organizers, Kikuo Kishimoto, Soon-Bok Lee, Qiang Yu ; sponsors, Tokyo Institute Technology (The 21st Cetntury COE Program), Japan Society of Mechanical Engineers (RC-202 Committee)

[Tokyo Institute of Technology], [2004]

タイトル別名

Workshop on Advanced Technology and Reliability of Electronic Devices and Systems (The 8th International Workshop, Dept. of Mechanical Sciences and Engineering)

詳細情報

• NII書誌ID(NCID): BA67503770
• 出版国コード: ja
• タイトル言語コード: eng
• 本文言語コード: eng
• 出版地: [Tokyo, Japan]
• ページ数/冊数: 1 v.
• 大きさ: 30 cm