Intrinsic point defects, impurities, and their diffusion in silicon

Author(s)

Bibliographic Information

Intrinsic point defects, impurities, and their diffusion in silicon

Peter Pichler

（Computational microelectronics）

Wien, c2004

Available at  / 4 libraries

Search this Book/Journal

Note

Includes bibliographical references and index

Related Books： 1-1 of 1

Details

  • NCID
    BA68538544
  • ISBN
    • 3211206876
  • Country Code
    au
  • Title Language Code
    eng
  • Text Language Code
    eng
  • Place of Publication
    Springer
  • Pages/Volumes
    xxi, 554 p.
  • Size
    25 cm
  • Classification
  • Parent Bibliography ID
Page Top