Testing for EMC compliance : approaches and techniques

Author(s)

• Montrose, Mark I.
• Nakauchi, Edward M.

Bibliographic Information

Testing for EMC compliance : approaches and techniques

Mark I. Montrose, Edward M. Nakauchi

IEEE , John Wiley, c2004

Note

Includes bibliographical references and index

"Wiley-interscience"

"IEEE Electromagnetic Compatibility Society, sponcer"

Details

• NCID: BA68913370
• ISBN:
  • 047143308X
• LCCN: 2003063488
• Country Code: us
• Title Language Code: eng
• Text Language Code: eng
• Place of Publication: Piscataway, N.J.,Hoboken, N.J.
• Pages/Volumes: xviii, 460 p.
• Size: 25 cm
• Classification:
  • LCC : TK7867.2
  • DC22 : 621.382/24
• Subject Headings:
  • LCSH : Electromagnetic compatibility
  • LCSH : Electromagnetic interference