ICMTS 2004, proceedings of the 2004 IEEE International Conference on Microelectronic Test Structures, March 22-25, 2004, Awaji Yumebutai International Conference Center, Japan

著者

• IEEE International Conference on Microelectronic Test Structures
• IEEE Electron Devices Society

書誌事項

ICMTS 2004, proceedings of the 2004 IEEE International Conference on Microelectronic Test Structures, March 22-25, 2004, Awaji Yumebutai International Conference Center, Japan

sponsored by the IEEE Electron Devices Society

Institute of Electrical and Electronics Engineers, c2004

注記

"IEEE catalog number: 04CH37516" -- T. p. verso

Includes bibliographical references and index

• NII書誌ID(NCID): BA69518961
• ISBN:
  • 0780382625
• LCCN: 2003114789
• 出版国コード: us
• タイトル言語コード: eng
• 本文言語コード: eng
• 出版地: [New York]
• ページ数/冊数: xii, 313 p.
• 大きさ: 28 cm