2004 IEEE International Reliability Physics Symposium proceedings : 42nd annual, Phoenix, Arizona, April 25-29, 2004

著者

• International Reliability Physics Symposium
• IEEE Electron Devices Society
• IEEE Reliability Society

書誌事項

2004 IEEE International Reliability Physics Symposium proceedings : 42nd annual, Phoenix, Arizona, April 25-29, 2004

sponsored by the IEEE Electron Devices Society and the IEEE Reliability Society

Institute of Electrical and Electronics Engineers, c2002, c2004

• : soft.

注記

Includes bibliographical references

"IEEE Catalog No. 04CH37533" -- T. p.

• NII書誌ID(NCID): BA69519272
• ISBN:
  • 078038315X
• LCCN: 82640313
• 出版国コード: us
• タイトル言語コード: eng
• 本文言語コード: eng
• 出版地: Piscataway, N.J.
• ページ数/冊数: xii, 748 p.
• 大きさ: 28 cm