Production testing of RF and system-on-a-chip devices for wireless communications

著者

• Schaub, Keith B.
• Kelly, Joe

書誌事項

Production testing of RF and system-on-a-chip devices for wireless communications

Keith B. Schaub, Joe Kelly

（The Artech House microwave library）

Artech House, c2004

注記

Includes bibliographical references and index

内容説明・目次

内容説明

This work provides an in-depth overview of cutting-edge RF and SOC (system on a chip) product testing for wireless communications.

「Nielsen BookData」 より

• NII書誌ID(NCID): BA69833710
• ISBN:
  • 1580536921
• 出版国コード: us
• タイトル言語コード: eng
• 本文言語コード: eng
• 出版地: Boston
• ページ数/冊数: xviii, 249 p.
• 大きさ: 26 cm
• 件名:
  • LCSH : Semiconductors -- Testing
  • LCSH : Wireless communication systems -- Equipment and supplies -- Testing
• 親書誌ID:
  • BA00537481