ISTFA 2004 : proceedings of the 30th International Symposium for Testing and Failure Analysis, November 14-18, 2004, Worcester's Centrum Centre, Worcester (Boston), Massachusetts

著者

• International Symposium for Testing and Failure Analysis
• ASM International
• Electronic Device Failure Analysis Society

書誌事項

ISTFA 2004 : proceedings of the 30th International Symposium for Testing and Failure Analysis, November 14-18, 2004, Worcester's Centrum Centre, Worcester (Boston), Massachusetts

sponsored by EDFAS, ISTFA, ASM International

ASM International, 2004

タイトル別名

ISTFA 2004 : conference proceedings from the 30th International Symposium for Testing and Failure Analysis

注記

Includes bibliographical references and index

詳細情報

• NII書誌ID(NCID): BA70003211
• ISBN:
  • 0871708078
• 出版国コード: us
• タイトル言語コード: eng
• 本文言語コード: eng
• 出版地: Materials Park, Ohio
• ページ数/冊数: xx, 697 p.
• 大きさ: 28 cm
• 付属資料: CD-ROM