Proceedings : International Test Conference 2004

著者

• International Test Conference
• IEEE Computer Society. Test Technology Technical Council
• Institute of Electrical and Electronics Engineers. Philadelphia Section

書誌事項

Proceedings : International Test Conference 2004

[sponsored by IEEE Computer Society, Test Technology Technical Council and IEEE Philadelphia Section]

International Test Conference, c2004

タイトル別名

International Test Conference 2004 : proceedings : October 26-October 28, 2004, Charlotte Convention Center, Charlotte, NC, USA

注記

"2004 International Test Conference, our 35th"--P. 1

IEEE Catalog Number: 04CH37586

Includes bibliographical references and index

詳細情報

• NII書誌ID(NCID): BA70122684
• ISBN:
  • 0780385802
• 出版国コード: us
• タイトル言語コード: eng
• 本文言語コード: eng
• 出版地: Washington, D.C.
• ページ数/冊数: xvi, 1459 p.
• 大きさ: 28 cm