Low-power deep sub-micron CMOS logic : sub-threshold current reduction
Author(s)
Bibliographic Information
Low-power deep sub-micron CMOS logic : sub-threshold current reduction
(The Kluwer international series in engineering and computer science, 841 . Analog circuits and signal processing)
Kluwer Academic, c2004
- : hb
Available at 2 libraries
  Aomori
  Iwate
  Miyagi
  Akita
  Yamagata
  Fukushima
  Ibaraki
  Tochigi
  Gunma
  Saitama
  Chiba
  Tokyo
  Kanagawa
  Niigata
  Toyama
  Ishikawa
  Fukui
  Yamanashi
  Nagano
  Gifu
  Shizuoka
  Aichi
  Mie
  Shiga
  Kyoto
  Osaka
  Hyogo
  Nara
  Wakayama
  Tottori
  Shimane
  Okayama
  Hiroshima
  Yamaguchi
  Tokushima
  Kagawa
  Ehime
  Kochi
  Fukuoka
  Saga
  Nagasaki
  Kumamoto
  Oita
  Miyazaki
  Kagoshima
  Okinawa
  Korea
  China
  Thailand
  United Kingdom
  Germany
  Switzerland
  France
  Belgium
  Netherlands
  Sweden
  Norway
  United States of America
Note
Includes bibliographical references (p. 145-150) and index
Description and Table of Contents
Description
1. 1 Power-dissipation trends in CMOS circuits Shrinking device geometry, growing chip area and increased data-processing speed performance are technological trends in the integrated circuit industry to enlarge chip functionality. Already in 1965 Gordon Moore predicted that the total number of devices on a chip would double every year until the 1970s and every 24 months in the 1980s. This prediction is widely known as "Moore's Law" and eventually culminated in the Semiconductor Industry Association (SIA) technology road map [1]. The SIA road map has been a guide for the in dustry leading them to continued wafer and die size growth, increased transistor density and operating frequencies, and defect density reduction. To mention a few numbers; the die size increased 7% per year, the smallest feature sizes decreased 30% and the operating frequencies doubled every two years. As a consequence of these trends both the number of transistors and the power dissi pation per unit area increase.In the near future the maximum power dissipation per unit area will be reached. Down-scaling of the supply voltage is not only the most effective way to reduce power dissipation in general it also is a necessary precondition to ensure device reliability by reducing electrical fields and device temperature, to prevent device degradation. A draw-back of this solution is an increased signal propa gation delay, which results in a lower data-processing speed performance.
Table of Contents
1. Introduction.- 1.1 Power-dissipation trends in CMOS circuits.- 1.2 Overview of present power-reduction solutions.- 1.3 Aim and scope of this book.- 1.4 Organization of the book.- 2. Power Versus Energy.- 2.1 Power considerations.- 2.2 Energy considerations.- 2.3 Conclusions.- 3. Power Dissipation in Digital CMOS Circuits.- 3.1 Thermodynamics of computation.- 3.2 Functional power dissipation.- 3.3 Parasitical power dissipation.- 3.4 Trends in power dissipation.- 3.5 Conclusions.- 4. Reduction of Functional Power Dissipation.- 4.1 Node transition-cycle activity factor.- 4.2 Clock frequency.- 4.3 Transition-cycle energy.- 4.4 Conclusions.- 5. Reduction of Parasitical Power Dissipation.- 5.1 Leakage power dissipation.- 5.2 Short-circuit power dissipation.- 5.3 Need for weak-inversion current reduction.- 5.4 Conclusions.- 6. Weak-Inversion Current Reduction.- 6.1 Classification.- 6.2 Conclusions.- 7. Effectiveness of Weak-Inversion Current Reduction.- 7.1 General effectiveness.- 7.2 Technique-specific effectiveness.- 7.3 Conclusions.- 8. Triple-S Circuit Designs.- 8.1 Process flow.- 8.2 Experimental circuits.- 8.3 Leakage, speed, area and functional power.- 8.4 Practical applications and limitations.- 8.5 Conclusions.- 9. Conclusions.- 10. Summary.- References.
by "Nielsen BookData"