Proceedings : 19th IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems, 10-13 October 2004, Cannes, France

Author(s)

• IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems
• IEEE Computer Society. Test Technology Technical Council
• IEEE Computer Society. Technical Committee on Fault-Tolerant Computing
• IEEE Computer Society
• Aitken, R.

Bibliographic Information

Proceedings : 19th IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems, 10-13 October 2004, Cannes, France

[edited by R. Aitken, ... [et al.] ] ; sponsored by IEEE Computer Society Technical Committee on Fault-Tolerant Computing (TCFTC), IEEE Computer Society Test Technology Technical Council (TTTC)

IEEE Computer Society, c2004

Other Title

2004 Proceedings : the 19th IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems

DFT2004

P2241

Note

Includes bibliographical references and index

"IEEE Computer Society Press Order Number P2241" -- T.p. verso

Details

• NCID: BA70206296
• ISBN:
  • 0769522416
• Country Code: us
• Title Language Code: eng
• Text Language Code: eng
• Place of Publication: Los Alamitos, Calif.
• Pages/Volumes: xii, 506 p.
• Size: 23 cm