Proceedings : 1966 Annual Symposium on Reliability , San Francisco, Calif., Jan. 25-27, 1966

著者

• Symposium on Reliability
• Institute of Electrical and Electronics Engineers
• Institute of Environmental Sciences
• American Society for Nondestructive Testing
• American Society for Quality Control

書誌事項

Proceedings : 1966 Annual Symposium on Reliability , San Francisco, Calif., Jan. 25-27, 1966

sponsored by IEEE, IES, SNT, ASQC

IEEE, c1966

タイトル別名

1966 Reliability Symposium

注記

IEEE Catalog No. 7 C 26

• NII書誌ID(NCID): BA70690778
• 出版国コード: us
• タイトル言語コード: eng
• 本文言語コード: eng
• 出版地: New York
• ページ数/冊数: iv, 764 p.
• 大きさ: 26 cm