Proceedings : 1966 Annual Symposium on Reliability , San Francisco, Calif., Jan. 25-27, 1966

Author(s)

• Symposium on Reliability
• Institute of Electrical and Electronics Engineers
• Institute of Environmental Sciences
• American Society for Nondestructive Testing
• American Society for Quality Control

Bibliographic Information

Proceedings : 1966 Annual Symposium on Reliability , San Francisco, Calif., Jan. 25-27, 1966

sponsored by IEEE, IES, SNT, ASQC

IEEE, c1966

Other Title

1966 Reliability Symposium

Note

IEEE Catalog No. 7 C 26

• NCID: BA70690778
• Country Code: us
• Title Language Code: eng
• Text Language Code: eng
• Place of Publication: New York
• Pages/Volumes: iv, 764 p.
• Size: 26 cm