Accelerated testing : statistical models, test plans and data analysis

Author(s)

• Nelson, Wayne

Bibliographic Information

Accelerated testing : statistical models, test plans and data analysis

Wayne B. Nelson

（Wiley series in probability and mathematical statistics）（Wiley-interscience paperback series）

Wiley, c2004

• : pbk.

Note

Includes bibliographical references (p. 561-577) and index

• NCID: BA70756424
• ISBN:
  • 0471697362
• Country Code: us
• Title Language Code: eng
• Text Language Code: eng
• Place of Publication: Hoboken, N.J.
• Pages/Volumes: xiv, 601 p.
• Size: 25 cm
• Classification:
  • LCC : QA276
  • DC20 : 519.5
• Subject Headings:
  • LCSH : Failure time data analysis
  • LCSH : Reliability (Engineering) -- Statistical methods
  • LCSH : Accelerated life testing -- Statistical methods
• Parent Bibliography ID:
  • BA00019013
  • BA63861881